Karthik Rao (he/him/his)
Texas A&M University
NIST Research Intern
National Institute of Standards and Technology (NIST)
Electrostatic force microscopy (EFM) is one of the non-contact atomic force microscopy techniques that gives access to electrostatic and electronic surface properties of samples with high precision. This technique involves applying a bias voltage to excite a cantilever oscillation, which oscillates with an amplitude that depends on the electrostatic force interaction between the probe tip and sample. COMSOL Multiphysics is a finite element analysis and multiphysics simulation software that allows conventional physics-based user interfaces. Using this software, simulations of EFM with different probe shapes was performed in both 2-D and 3-D. The results of these simulations will be compiled into a database that will be used in determining unknown probe shapes in the future.
I am a graduating senior at Texas A&M University earning a B.S. in Physics and a B.S. in Computer Science with minors in Math and Cybersecurity. After graduating, I plan to pursue a PhD in condensed matter physics and my overall goal is to stay in physics and continue research.
I have had several research experiences at my home institution in areas such as computational chemistry, superconductivity, nuclear astrophysics, theoretical quantum optics, and deep learning. My biggest research experience involved creating a particle detector at the Cyclotron Institute to be used in nuclear astrophysics experiments involving detection of low energy heavy ions using indirect methods. I am really excited to be interning with NIST this summer.
Outside of research, I have served leadership positions in student organisations such as the Corps of Cadets, our local chapter of SPS, and such. I love to read, play video games, board games and DnD.