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NIST Research Intern
National Institute of Standards and Technology (NIST)
Developing New Characterization Techniques
Jose and fellow SPS intern Vanessa are working with the CMOS and Novel Devices Group, Engineering Physics Division, Physical Measurement Laboratory at the National Institute for Standards and Technology (NIST). The CMOS and Novel Devices Group develops new characterization techniques, physics-based models, and data analysis methods to accelerate the commercialization and manufacture of high performance and reliable electron devices for the electronics industry. The Group develops the advanced metrology tools to enable quantitative and mechanistic assessment of reliability issues in emerging electronic devices. Another key thrust is to develop new measurements, physical models, and data analysis techniques to accelerate the development and commercialization of nanoelectronic device-based medical technology for life sciences and personalized health care.
COMSOL Simulation Study of the Effect of Probe Tip Shape on the Measurement of an Electrical Field Gradient Generated by MicroelAbstract:
Precision, nano-scale electric field measurements are one useful technique for characterizing nanoelectronic devices, and other nanoscaled structures and materials. The Scanning Kelvin Force Microscopy (SKFM) is one scanning probe technique utilized to measure the surface potential of a biased structure or materials with variations in work function. However, high spatial resolution measurements of electric fields that vary with location are dependent on the shape of the detecting probe tip. COMSOL Multi-Physics models were created for electrical field measurements with representative probe tip shapes and microelectronic test structures. Data demonstrated that the differential of the potential generated by small changes in tip-sample separation was more sensitive to tip shape than the potential at any given tip-sample separation. Significant decrease of change in potential across the boundary of the ground plane and biased metal line caused by averaging effect of cantilever. The width of the response could also be related to the top width of the conical probe. These results indicate that information about the electrical shape of the tip can be extracted from the measured response using a known field distribution and will be used to help design an electrical tip shape profiler reference material.
My name is Jose Juan Corona Jr., I am a recent graduate of Bridgewater College with a BS in Applied Physics and minor in Mathematics. I am a hardworking individual who always gives his maximum effort in attaining the end result. I have always been a team player, and believe that working together we can achieve the solution to a problem. I am someone who can get along with just about anyone and enjoy making new friendships.
There are many activities that I like to participate in. Some of these hobbies include: playing soccer, disc sports (such as disc golf and ultimate frisbee), staying active (working out and going for walks/runs), and more. I occasionally play video games, but I am always willing to play for the sake of fellowship. I am always willing to learn new things, so any new activities that arise this summer I will be ready to engage in!